2012 28th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) 2012
DOI: 10.1109/stherm.2012.6188819
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Experimental thermal resistance evaluation of a three-dimensional (3D) chip stack, including the transient measurements

Abstract: For the thermal management of three-dimensional (3D

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Cited by 19 publications
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References 9 publications
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