Experimental validation of the generalized accurate modelling method for system-level bulk current injection setups up to 1 GHz

Abstract

A small-signal model of an automotive system-level bulk current injection (BCI) setup developed with a generalized accurate method shown in the previous publication [3] is verified on a case study with a demonstrator EUT module. The work utilizes an equivalent circuit modelling approach for the floating ungrounded EUT board and a macromodel for an active DUT IC. The simulation-based prediction of the BCI test results using an IC failure threshold and a small-signal simulation of RF levels at floating EUT module under BCI tests is shown. Due to high accuracy and detail of the BCI setup model, the prediction also shows very good correlation to real measurement data, both qualitatively and quantitatively, up to 1 GHz.

A Technique to Assess Conducted Immunity of an Electronic Equipment after an Obsolete Integrated Circuit Change

“…The method to determine this equivalent source in BCI test is not covered in this paper. Interested readers could find information about this topic in papers such as [8] [9] [10] [11].…”