Proceedings of the 2024 IEEE/ACM 46th International Conference on Software Engineering: Companion Proceedings 2024
DOI: 10.1145/3639478.3643125
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Exploring Data Cleanness in Defects4J and Its Influence on Fault Localization Efficiency

Md Nakhla Rafi,
An Ran Chen,
Tse-Hsun (Peter) Chen
et al.
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