2022 IEEE International Integrated Reliability Workshop (IIRW) 2022
DOI: 10.1109/iirw56459.2022.10032753
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Exploring Process-Voltage-Temperature Variations Impact on 4T1R Multiplexers for Energy-aware Resistive RAM-based FPGAs

Tommaso Rizzi
1
,
Andrea Baroni
2
,
Artem Glukhov
3
et al.
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