Extended defects in vanadium doped rutile. An EPR and TEM study

Abstract

Electron microscopy and diffraction coupled with electron paramagnetic resonance are used to study the system TiO2,‐V2O2on samples prepared at 1373 K. Substitutional and/or interstitial V4+ ions are detected at low concentrations of V2O2 together with isolated extended defects. At higher vanadium concentrations (≥ 5wt % V2O2) the extended defects order giving rise to a, homologous series (MnO2n‐l (M = Ti + V). Simultaneously with this ordering process strong interactions occur between the paramagnetic vanadium ions which would appear to be close to the crystallographic shear planes.