Abstract:Parametric retrieval of electromagnetic properties is important for both new materials characterization and an accurate design of devices. While quite a few techniques have been developed over the years, precise mapping of high-permittivity samples remain challenging. Here we advance a so-called micro-strip technique, where transmission coefficients of a waveguide system with an analyte on top are used to extract electromagnetic parameters of the later. Our cross-like strip line configuration has a split ring … Show more
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