Extraction of Permittivity from Reflection Data: Lossless Case

Abstract

Two fast algorithms for determining the electrical property and the thickness of a lossless dielectric slab are presented. The first algorithm processes the complex reflection coefficient in the frequency domain, while the other requires only the amplitude data. Both algorithms are established from a foryard model that is derived with the WKB approximation. The permittivity profile and the thickness of the test sample can be retrieved in an average sense. The algorithms are tested on simulation as well as experimental data.