Extrinsic Mobility Degradation Extraction in GFETs for Technologies Benchmarking

Pacheco-Sanchez, Anibal; Mavredakis, Nikolaos; Jiménez, David

doi:10.1109/cde58627.2023.10339436

2023 14th Spanish Conference on Electron Devices (CDE) 2023

DOI: 10.1109/cde58627.2023.10339436

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Extrinsic Mobility Degradation Extraction in GFETs for Technologies Benchmarking

Anibal Pacheco-Sanchez,

Nikolaos Mavredakis,

David Jiménez

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Extrinsic Mobility Degradation Extraction in GFETs for Technologies Benchmarking

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References 17 publications

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