Fabric surface defect classification and systematic analysis using a cuckoo search optimized deep residual network

Mewada, Hiren; Pires, Ivan Miguel; Engineer, Pinalkumar; Patel, Amit V.

doi:10.1016/j.jestch.2024.101681

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Fabric surface defect classification and systematic analysis using a cuckoo search optimized deep residual network

Cited by 4 publications

References 38 publications

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