Organic–inorganic
composite scintillation films, recognized
for their cost-efficiency and tunable scintillation characteristics,
have been the subject of extensive research due to their considerable
promise for use in X-ray flat panel imaging applications. This study
presents a composite scintillation film utilizing Gd2O2S:Pr phosphors, traditional yet effective in this application.
By optimizing the solid-state reaction process and employing acid
pickling to eliminate impurities, we achieved Gd2O2S:Pr phosphors with pure phase and precise stoichiometric
ratios. Subsequently, these phosphors were combined with epoxy resin
to fabricate a composite scintillation film, which demonstrated excellent
structural uniformity and flexibility. Furthermore, its imaging performance
was evaluated under X-ray irradiation, revealing a resolution of 8
line pairs per millimeter. This outcome underscores the substantial
promise of our films for advanced X-ray imaging applications, paving
the way for future advancements in this domain.