Failure analysis of odd/even word-line failure to improve the endurance performance of a NAND Flash

Sun, Young; Zhang, Mark; Yu, Jossen; Dong, Walden; Chien, Wei-Ting Kary

doi:10.1109/ipfa.2009.5232715

2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits 2009

DOI: 10.1109/ipfa.2009.5232715

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Failure analysis of odd/even word-line failure to improve the endurance performance of a NAND Flash

Young Sun

Mark Zhang

Jossen Yu

et al.

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Failure analysis of odd/even word-line failure to improve the endurance performance of a NAND Flash

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References 24 publications

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