2009
DOI: 10.1016/j.microrel.2009.07.049
|View full text |Cite
|
Sign up to set email alerts
|

Failure analysis of video processor defined as No Fault Found (NFF): Reproduction in system level and advanced analysis technique in IC level

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
4
0

Year Published

2010
2010
2018
2018

Publication Types

Select...
5

Relationship

1
4

Authors

Journals

citations
Cited by 7 publications
(4 citation statements)
references
References 8 publications
0
4
0
Order By: Relevance
“…References Fault diagnostics [1,2,3,6,7,8,9,10,11,12,13,14,15,16,17,18,19] System design [1,13,18,19,20,21,22,23,24,25,26,27,28,29,30,31,32] Human factors [1,20,32,33,34,35,36,37] Data management [1,20,37,38,39] 1 [1,26] are review papers on the NFF.…”
Section: Categorymentioning
confidence: 99%
“…References Fault diagnostics [1,2,3,6,7,8,9,10,11,12,13,14,15,16,17,18,19] System design [1,13,18,19,20,21,22,23,24,25,26,27,28,29,30,31,32] Human factors [1,20,32,33,34,35,36,37] Data management [1,20,37,38,39] 1 [1,26] are review papers on the NFF.…”
Section: Categorymentioning
confidence: 99%
“…A pure tin finish is well known to produce conductive 'metal whiskers', that are capable of producing unintended current paths. These failures usually appear intermittently, making it difficult to identify them as a root cause to the problem; they are easily broken off and can melt to remove a previously existing short 3 [8]. In the case of a reported failure where there is no 'hard' (or definite) symptom for a sufficient fault diagnosis; there will be the need for additional technical data or specialist technical knowledge.…”
Section: Printed Circuit Board Interconnectorsmentioning
confidence: 99%
“…Part 1 also focused on No Fault Found (NFF) standards, and how such events can cause unprecedented changes in the service performance, impact dependability and escalate safety concerns. This has long been revealed with a variety of products, within a wide range of industries [1,2,3,4].…”
Section: Introductionmentioning
confidence: 99%
“…The test method to screen the problems, which happen in the infant failure ( Fig. 1) and random failure period, during the developing period is not enough [2].…”
Section: Introductionmentioning
confidence: 99%