Failure detection technique for 2/2um RDL on FOPLP

Gunji, Keita; Takagi, Noriaki; Hibarino, Toshibisa

doi:10.1109/eptc47984.2019.9026657

2019 IEEE 21st Electronics Packaging Technology Conference (EPTC) 2019

DOI: 10.1109/eptc47984.2019.9026657

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Failure detection technique for 2/2um RDL on FOPLP

Keita Gunji

Noriaki Takagi

Toshibisa Hibarino

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Failure detection technique for 2/2um RDL on FOPLP

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References 4 publications

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