Failure isolation using FIB assist Photon Emission Microscopy analysis and microprobe analysis

Wen, Gaojie; Liu, Binghai; Wang, Winter; Li, Jinglong; Liu, Tian; Wang, Xuezhu

doi:10.1109/ipfa.2011.5992737

18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2011

DOI: 10.1109/ipfa.2011.5992737

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Failure isolation using FIB assist Photon Emission Microscopy analysis and microprobe analysis

Gaojie Wen¹,

Binghai Liu²,

Winter Wang³

et al.

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Cited by 7 publications

References 5 publications

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Study on light sensitive functional failures in VLSI failure analysis

Wen¹,

Fan²,

Liu³

et al. 2013

Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

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Functional failures which were sensitive to temperature or voltage were usually seen in failure analysis and many strategies have been employed to solve this kind of failure. But some special failed ICs which were sensitive to light post decapsulation were difficult to handle. Three light sensitive functional failure cases were presented in this paper to show how we can find the root cause efficiently and what kind of mechanism lead to them sensitive to light.

show abstract

Study on light sensitive functional failures in VLSI failure analysis

Wen¹,

Fan²,

Liu³

et al. 2013

Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

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Fault isolation by conquering obstruction effect of resistor in complex cases analysis

Wen¹

2014

Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

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Resistor plays a key role in circuit designer's view as it was indispensable for the whole circuit function. But for integrated circuit failure analysis, the effect of resistor contained both guidance and as well as blocks to find the root cause. The obstruction effect of resistor was seldom studied in failure analysis. This paper presented how resistor to be block for failure analysis. And how to conquer the obstruction effect was also studied which will be helpful in analyzing complicated failure cases.

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Simulation assisting EMMI technical to locate defect on capacitor in integrated circuit failure analysis

Wen¹,

Liu²,

Fan³

et al. 2016

2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

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Failure isolation using FIB assist Photon Emission Microscopy analysis and microprobe analysis

Cited by 7 publications

References 5 publications

Study on light sensitive functional failures in VLSI failure analysis

Study on light sensitive functional failures in VLSI failure analysis

Fault isolation by conquering obstruction effect of resistor in complex cases analysis

Simulation assisting EMMI technical to locate defect on capacitor in integrated circuit failure analysis

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