Instrum Exp Tech
 2023
DOI: 10.1134/s0020441223060106
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Fast Methods for Studying the Effect of Electrical Stress on SiO2 Dielectrics in Metal-Oxide-Semiconductor Field-Effect Transistors

Dhia Elhak Messaoud,
Boualem Djezzar,
Mohamed Boubaaya
et al.
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