Fault Tolerance in Reversible Logic Circuits and Quantum Cost Optimization

Abstract

Energy dissipation is a prominent factor for the very large scale integrated circuit (VLSI). The reversible logic-based circuit was capable to compute the logic without energy dissipation. Accordingly, reversible circuits are an emerging domain of research based on the low value of energy dissipation. At nano-level design, the critical factor in the logic computing paradigm is the fault. The proposed methodology of fault coverage is powerful for testability. In this article, we target three factors such as fault tolerance, fault coverage and fault detection in the reversible KMD Gates. Our analysis provides good evidence that the minimum test vector covers the 100 % fault coverage and 50 % fault tolerance in KMD Gate.