Features of the Structure and the Optical and Electrical Properties of SiO2:Cu° Thin Films Deposited by Pulsed-Laser Evaporation

Boiko, A. A.; Al-Kamali, M. F. S. H.; Mikhalko, A. M.; Frolov, S. A.

doi:10.1134/s2635167623700118

Nanotechnol Russia

2023

DOI: 10.1134/s2635167623700118

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Features of the Structure and the Optical and Electrical Properties of SiO2:Cu° Thin Films Deposited by Pulsed-Laser Evaporation

A. A. Boiko,

M. F. S. H. Al-Kamali,

A. M. Mikhalko

et al.

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Features of the Structure and the Optical and Electrical Properties of SiO2:Cu° Thin Films Deposited by Pulsed-Laser Evaporation

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References 9 publications

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