“…It is desirable to have accurate structure data, without external fields, to obtain the microscopic structural changes. Therefore, the data determined by Abrahams et aL (Abrahams, Reddy & Bernstein, 1966;Abrahams & Bernstein, 1967;Abrahams, Hamilton & Sequeira, 1967) are refined by the measurement of the ratios of the diffracted intensities of X-rays from the two opposite surfaces, (00h) and (00h). Then the observed variations of the integrated intensities, AI/I, are analysed first by assuming the ionic displacement alone and next by taking into account two other factors; one is the change in the temperature factor due to the electric-field-induced variation of phonon frequencies, and the other is the redistribution of bonding electrons of Nb-O and Ta-O bonds.…”