Field Ion Evaporation from Tip and Sample in the STM for Atomic-Scale Surface Modification

Kobayashi, Aki; Grey, F.; Uchida, Hironaga; Huang, Dehuan; Aono, Masakazu

doi:10.1007/978-94-011-2024-1_4

Cited by 1 publication

(1 citation statement)

References 7 publications

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“…Vertical processes involve atom transfers between the tip and the surface, voltage pulse or direct tip-surface contact being used for the atom transfers. Adsorbates or native surface atoms can be either permanently extracted by the tip 11,12,13,14,15,16,17,18,19,20,21,22 or redeposited in another location 23,24,25,26 . This mode has been theoretically studied by several groups 27,28,29,30,31,32,33 .…”

Section: Introductionmentioning

confidence: 99%

Theory of single atom manipulation with a scanning probe tip: Force signatures, constant-height, and constant-force scans

Pizzagalli

Baratoff

2003

Phys. Rev. B

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We report theoretical results predicting the atomic manipulation of a silver atom on a Si(001) surface by a scanning probe tip, and providing several new insights about the manipulation phenomena. A molecular mechanics technique has been used, the system being described by a quantum chemistry method for the short-range interactions and an analytical model for the long-range ones. Taking into account several shapes, orientations, and chemical natures of the scanning tip, we observed four different ways to manipulate the deposited atom in a constant-height mode. In particular, the manipulation is predicted to be possible with a Si(111) tip for different tip shapes and adatom locations on the silicon surface. The calculation of the forces during the manipulation revealed that specific variations can be associated with each kind of process. These force signatures, like the tip height signatures observed in STM experiments, could be used to deduce the process involved in an experiment. Finally, we present preliminary results about the manipulation in constant-force mode.

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