Film structure and magnetic properties of CoNiCr/Cr sputtered thin film

Ishikawa, M.; Tani, N.; Yamada, T.; Ota, Yasutomo; Nakamura, Koshi; Itoh, Akio

doi:10.1109/tmag.1986.1064562

Cited by 45 publications

(5 citation statements)

References 3 publications

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“…For Cr thickness ranging from sooA to 1000A, the coercivity decreases significantly from 900 Oe to 700 Oe and approaches 400 Oe asymptotically. The experimental results shown in Fig.1 and 2 can be interpreted by epitaxial growth of the Coer films on the Cr underlayer [2]. When CoCr films grow on Cr underlayers, their easy-axis(C-axis) of crystal anisotropy lies in the film plane and the films exhibit high coercivity.…”

Section: Resultsmentioning

confidence: 87%

“…The thickness and microstructure of the Cr underlayers affect the nature of the magnetization reversal. The Cr in CoCr films is believed to isolate grains magnetically and to reduce zig-zag domain noise [2,5]. One way to investigate magnetic decoupling between grains is to determine the magnetization reversal mechanism by measuring the angular dependence of coercive force and hysteresis loss.…”

Section: Introductionmentioning

confidence: 99%

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EFFECTS OF Cr UNDERLAYERS AND CoCr THICKNESS ON THE COERCIVITY AND THE MAGNETIZATION REVERSAL MECHANISMS IN CoCr/Cr FILMS

Chen

Judy

et al. 1989

J. Magn. Soc. Jpn.

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Abstract---The magnetization reversal mechanisms in RF sputtered CoCr films with and without Cr underlayers have been investigated by measuring the angular dependence of the coercivity and hysteresis loss. Peak coercivity angles were observed to shift downward as the CoCr film thickness was increased for no Cr underlayers, and the shift direction was reversed with a thick Cr underlayer. Moreover, it was found that the Cr underlayers changed the magnetization reversal mechanism from domain wall motion to incoherent curling rotation in the thin CoCr films while the Cr underlayers had little influence on the switching modes in thick CoCr films.

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Section: Resultsmentioning

confidence: 87%

Section: Introductionmentioning

confidence: 99%

EFFECTS OF Cr UNDERLAYERS AND CoCr THICKNESS ON THE COERCIVITY AND THE MAGNETIZATION REVERSAL MECHANISMS IN CoCr/Cr FILMS

Chen

Judy

et al. 1989

J. Magn. Soc. Jpn.

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“…The presence of Cr in [Co/Ni] may also lead to the shift of the [Co/Ni] peak towards the NiCr peak in the XRD pattern shown in Fig.1(a), probably resulting in the formation of Co-Ni-Cr alloy. Furthermore, the observed change in magnetic properties can likely be attributed to the formation of the Co-Ni-Cr alloy 46,47 . Indeed, the uniform diffusion of Cr was reported to cause µ 0 H c increase in Co-Ni film with in-plane anisotropy 48 .…”

Section: Impact Of Diffusion On the Static Magnetic Propertiesmentioning

confidence: 99%

Seed layer impact on structural and magnetic properties of [Co/Ni] multilayers with perpendicular magnetic anisotropy

Liu

Swerts

Devolder

et al. 2017

Journal of Applied Physics

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[Co/Ni] multilayers with perpendicular magnetic anisotropy (PMA) have been researched and applied in various spintronic applications. Typically the seed layer material is studied to provide the desired facecentered cubic (fcc) texture to the [Co/Ni] to obtain PMA. The integration of [Co/Ni] in back-end-of-line (BEOL) processes also requires the PMA to survive post-annealing. In this paper, the impact of NiCr, Pt, Ru, and Ta seed layers on the structural and magnetic properties of [Co(0.3 nm)/Ni(0.6 nm)] multilayers is investigated before and after annealing. The multilayers were deposited in-situ on different seeds via physical vapor deposition at room temperature. The as-deposited [Co/Ni] films show the required fcc(111) texture on all seeds, but PMA is only observed on Pt and Ru. In-plane magnetic anisotropy (IMA) is obtained on NiCr and Ta seeds, which is attributed to strain-induced PMA loss. PMA is maintained on all seeds after post-annealing up to 400 • C. The largest effective perpendicular anisotropy energy (K eff U ≈ 2 × 10 5 J/m 3 ) after annealing is achieved on NiCr seed. The evolution of PMA upon annealing cannot be explained by further crystallization during annealing or strain-induced PMA, nor can the observed magnetization loss and the increased damping after annealing. Here we identify the diffusion of the non-magnetic materials from the seed into [Co/Ni] as the major driver of the changes in the magnetic properties. By selecting the seed and post-annealing temperature, the [Co/Ni] can be tuned in a broad range for both PMA and damping.

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“…Contemporary investigations involved chemically deposited Co-P and Co-Ni-P films [32] and Co-alloy films, such as Co-Pt [33], sputter deposited without an underlayer. High coercivities were obtained from ternary systems such as Co-Ni-Cr on Cr [34]. It soon became clear that reproducible disk processing was best obtained by sputter deposition and that high coercivities and optimal recording properties could be obtained on ternary Co-Cr-Pt,Ta systems deposited on Cr or Cr-alloy underlayers [35].…”

Section: The Magnetic Layer(s)mentioning

confidence: 99%

Thin film magnetic recording media

Grundy

1998

J. Phys. D: Appl. Phys.

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The continuing and very rapid growth in storage capacity in computer disk drives is dependent on many factors, including continuing developments of the thin film magnetic recording medium. Following a very brief description of a disk drive this review considers the various layers that make up the disk drive coating, with particular emphasis on the magnetic properties and microstructure of the storage layer. It also outlines techniques used to fabricate and magnetically characterize disks and concludes with current ideas for future development of the technology.

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Film structure and magnetic properties of CoNiCr/Cr sputtered thin film

Cited by 45 publications

References 3 publications

EFFECTS OF Cr UNDERLAYERS AND CoCr THICKNESS ON THE COERCIVITY AND THE MAGNETIZATION REVERSAL MECHANISMS IN CoCr/Cr FILMS

EFFECTS OF Cr UNDERLAYERS AND CoCr THICKNESS ON THE COERCIVITY AND THE MAGNETIZATION REVERSAL MECHANISMS IN CoCr/Cr FILMS

Seed layer impact on structural and magnetic properties of [Co/Ni] multilayers with perpendicular magnetic anisotropy

Thin film magnetic recording media

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