Flux growth and low temperature dielectric relaxation in piezoelectric Pb[(Zn_1/3Nb_2/3)_0.91Ti_0.09]O₃ single crystals

Abstract

Single crystals of Pb[(Zn1/3Nb2/3)0.91Ti0.09]O3 (PZNT 91/9) have been grown by flux method after modifications in temperature profile, flux ratio and addition of excess ZnO/B2O3 which resulted in enhanced perovskite yield (more than 95%). Only a few crystals showed the presence of pyrochlore phase/variation in composition. A comparative characterization of these crystals were carried out in respect of piezoelectric charge coefficient d33, dielectric constant, ac conductivity and hysteresis loop after cutting and poling the crystals along [001] direction. The total activation energy for conduction has been found to increase with Ti‐content in the sample. The effect of ZnO on growth behavior has been analyzed. A detailed analysis of PZNT (91:9) has been carried out at low temperature in respect of the various thermodynamic parameters related to the dielectric relaxation mechanism, like optical dielectric constant, static dielectric constant, free energy of activation for dipole relaxation, enthalpy of activation and relaxation time, have been calculated in the vicinity of transition temperature in the lower temperature region. The activation energy for relaxation at ‐10 and ‐49 °C have been found to be 0.09 and 0.02 eV respectively. The results were analyzed and a detailed dielectric analysis and low temperature relaxation behavior of PZNT crystals were interpreted. (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

Impedance analysis and high temperature conduction mechanism of flux grown Pb(Zn1/3Nb2/3)0.91Ti0.09O3 single crystal

“…Single crystals of PZN-PT were grown by self flux method [11]. The electrical characterization of the PZN-PT single crystal was carried out by impedance spectroscopy on a rectangular shaped 4x3x1 mm 3 sample after cleaning with acetone and drying at 80 °C.…”

Composition dependence of dispersion and bandgap properties in PZN-xPT single crystals

“…17,18 The crystals were oriented in [100] direction and cut into square slices with thickness of 1 mm. Silver paste was painted on the sample surfaces and sintered at 580 C for 30 min.…”

Crystal growth of PZN‐PT single crystals and critical issues for higher piezoelectric coefficient

“…The XRD profile of (200) reflection at 2θ = 44.5° clearly indicates the rhombohedral splitting for x=0.09 composition which confirms the coexistence of the rhombohedral and the tetragonal phases near MPB [13,14]. The XRD profile of (200) reflection at 2θ = 44.5° clearly indicates the rhombohedral splitting for x=0.09 composition which confirms the coexistence of the rhombohedral and the tetragonal phases near MPB [13,14].…”