Fourier Transform - Materials Analysis 2012
DOI: 10.5772/36120
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Fourier Transform Infrared Spectroscopy for the Measurement of Spectral Line Profiles

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Cited by 7 publications
(5 citation statements)
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“…To minimize the root-mean-square deviation between measured and calculated extinction spectrum, we used the downhill simplex algorithm as the optimization technique in the iterative adjustment of the k(ν) spectrum (Press et al, 1992). The measured spectrum is provided in a digital resolution of about 0.24 cm −1 , resulting from an approximately doubled size of the original interferogram due to zerofilling with a factor of 2 (Aroui et al, 2012). Overall, this amounts to 21 572 wavenumber grid points for the k(ν) spectrum in the wavenumber range between 800 and 6000 cm −1 .…”
Section: Application Of the New Refractive Index Data Setmentioning
confidence: 99%
“…To minimize the root-mean-square deviation between measured and calculated extinction spectrum, we used the downhill simplex algorithm as the optimization technique in the iterative adjustment of the k(ν) spectrum (Press et al, 1992). The measured spectrum is provided in a digital resolution of about 0.24 cm −1 , resulting from an approximately doubled size of the original interferogram due to zerofilling with a factor of 2 (Aroui et al, 2012). Overall, this amounts to 21 572 wavenumber grid points for the k(ν) spectrum in the wavenumber range between 800 and 6000 cm −1 .…”
Section: Application Of the New Refractive Index Data Setmentioning
confidence: 99%
“…4, trace b), which, similar to the spectrum of the annealed particles mentioned in the Introduction, clearly exhibits the spectral characteristics of -NAD reported in . The spectrum was interpolated to the wavenumber grid of our measurement, which was provided at a digital resolution of about 2 cm -1 , resulting from an approximate doubling of the size of the original interferogram due to zero-filling by a factor of two (Aroui et al, 2012). For thin film spectra, the absorbance is directly proportional to 𝑘( ̃) •  ̃.…”
Section: Retrieval Scheme For Deriving the Optical Constants Of -Nadmentioning
confidence: 99%
“…FTIR spectroscopy is used to quickly and definitively detect chemicals. It can be used in all stages of the product lifecycle, including design, manufacturing, and failure analysis [47,48].…”
Section: Fourier Transform Infrared Spectroscopy (Ftir)mentioning
confidence: 99%