2008
DOI: 10.1063/1.2937302
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Fractal Image Informatics: from SEM to DEM

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Cited by 6 publications
(9 citation statements)
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“…This can be observed by comparing different parts of the same image both at the local scale (reference lines) and at the global scale (firmagrams). As an example of the efficiency of the proposed comparison technique (Fractal Image Informatics, Oleschko et al, 2004Oleschko et al, , 2008, we discuss the case of the L33 firmagram (Fig. 6).…”
Section: Firmagrams Of Digital Imagesmentioning
confidence: 99%
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“…This can be observed by comparing different parts of the same image both at the local scale (reference lines) and at the global scale (firmagrams). As an example of the efficiency of the proposed comparison technique (Fractal Image Informatics, Oleschko et al, 2004Oleschko et al, , 2008, we discuss the case of the L33 firmagram (Fig. 6).…”
Section: Firmagrams Of Digital Imagesmentioning
confidence: 99%
“…The algorithm Histo_Gen (Parrot, 2003) was applied to the .raw image, transforming it to a column of intensity values, following the original pixel arrangement across the 2-dimensional image. The roughness of this linear array (.ts extension), called firmagram (from the Spanish firma = signature, Oleschko et al, 2008) and of some segments of the column data, called reference lines (Oleschko et al, 2004) were measured. The fractal analysis of the complete firmagram (global scale) and of selected reference lines (local scale) was performed by the Rescaled Range technique (R/S) of the commercial software, Benoit v1.2 (1999).…”
Section: Soil Cover Estimation By Digital Imaging and Fractal Techniquesmentioning
confidence: 99%
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“…The lack of reference techniques, standards and quality control for the measurements of these basic attributes of complex systems, makes difficult any intergroup comparisons of the usually extensive data surveys, resulting in unsustainable decision-making. In this study, we combine some principles and techniques of Fractal Geometry, Metrology, Informatics, Probability Theory and Statistics to create a new branch of Metrology, what we propose to call Fractal Metrology, and introduce scale invariant roughness as the main measurand of SI, UNI, NL, COM and CR of complex systems (Oleschko et al, 2008).…”
Section: Introductionmentioning
confidence: 99%