2022
DOI: 10.26866/jees.2022.6.r.135
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Free-Space Two-Tier One-Port Calibration Using a Planar Offset Short for Material Measurement

Abstract: The scattering parameters of a material under test (MUT) are prerequisites for characterizing the material parameters of the MUT. This paper describes a free-space two-tier one-port calibration method using a planar offset short as a free-space calculable reflect standard for measuring the scattering parameters of an MUT from the two successive one-port calibrations of a free-space material measurement system without a precise positioning system in free space. The two-tier one-port calibration method is valida… Show more

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