2013
DOI: 10.2528/pier13050312
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Frequency Dependent Model of Sheet Resistance and Effect Analysis on Shielding Effectiveness of Transparent Conductive Mesh Coatings

Abstract: Abstract-A frequency dependent model of sheet resistance of transparent conductive mesh coatings is proposed based on transmission line theory and vilified by experiments. And the effect on shielding effectiveness of frequency dependent sheet resistance is analyzed. Simulation results of shielding effectiveness are compared with the experimental data of a mesh-coated window sample with equivalent parameters fabricated and measured by Exotic Electro-Optics. The agreement between experiment and simulated proves … Show more

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Cited by 31 publications
(23 citation statements)
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“…Using frequency dependent model of sheet resistance of conductive coatings proposed by Liu and Tan [39] it is possible to calculate the resistance or conductivity at millimeter and terahertz frequencies based on measured DC resistivity values:…”
Section: Results Of Experimental Study Of Electrical Propertiesmentioning
confidence: 99%
“…Using frequency dependent model of sheet resistance of conductive coatings proposed by Liu and Tan [39] it is possible to calculate the resistance or conductivity at millimeter and terahertz frequencies based on measured DC resistivity values:…”
Section: Results Of Experimental Study Of Electrical Propertiesmentioning
confidence: 99%
“…Noll [1] and Liu [2] have studies that show SE modelling and calculations for grid type shielding geometries. These works theoretically and experimentally show that to keep grid line spacing as small as possible will improve shielding efficiency at higher frequencies.…”
Section: Decision Of Grid Parametersmentioning
confidence: 99%
“…These works summarize how to calculate and models the SE curves of EMI meshes and compare experimental results with modelled ones theoretically. Noll [1], Liu [2], Jacoby [4],Halman [7], Xu [8] and Wang [9] have published papers about this issue.…”
Section: Introductionmentioning
confidence: 99%
“…Экранирование электромагнитного излучения происходит за счет поглощения и отражения. Следует отметить, что в случае толстых пленочных структур также необходимо учитывать множественные отражения [10]. Коэффициент отражения (R), передачи (T SHF ) и поглощения (A) мощности можно выразить как [10].…”
Section: поступило в редакцию 3 августа 2020 г в окончательной редакunclassified