2018
DOI: 10.3390/mi9070313
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Friction Determination by Atomic Force Microscopy in Field of Biochemical Science

Abstract: Atomic force microscopy (AFM) is an analytical nanotechnology in friction determination between microscale and nanoscale surfaces. AFM has advantages in mechanical measurement, including high sensitivity, resolution, accuracy, and simplicity of operation. This paper will introduce the principles of mechanical measurement by using AFM and reviewing the progress of AFM methods in determining frictions in the field of biochemical science over the past decade. While three friction measurement assays—friction morph… Show more

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Cited by 19 publications
(19 citation statements)
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“…The lateral force acting on the tip is linearly proportional to this angle and can be related to the surface friction. LFM was used to study cells [ 61 ] and immunoglobulin (IgG) [ 62 ], even though it is not commonly used in biomedical research due to friction-induced sample damage.…”
Section: Mechanobiology With Afmmentioning
confidence: 99%
“…The lateral force acting on the tip is linearly proportional to this angle and can be related to the surface friction. LFM was used to study cells [ 61 ] and immunoglobulin (IgG) [ 62 ], even though it is not commonly used in biomedical research due to friction-induced sample damage.…”
Section: Mechanobiology With Afmmentioning
confidence: 99%
“…Small angle x-ray scattering (SAXS) [59] Topological structure From the nanoscopic through continuum length scales Confocal reflection microscope (CRM) [61] Sensitive to details of network structure Confocal fluorescence microscopy (CFM) [61,64] Higher 3D network topology fidelity Second harmonic microscope (SHG) [60,65] More accurate detection of authentic collagen fiber Scanning electron microscope (SEM) [62] Require scaffolding and drying, alter the collagen network Transmission electron microscopy (TEM) [63] X-ray diffraction technology [66] Molecular level, 3D reconstruction Cryo-electron microscopy (Cryo-EM) [67] Molecular level, 3D reconstruction, the most real in-situ information of samples Atomic force microscopy (AFM) [68,69,[77][78][79][80] Topological structure & Mechanic…”
Section: Instrument Applications Characteristicsmentioning
confidence: 99%
“…Generally, a sharp probe with a small elastic coefficient (<1 Nm −1 ) can be selected to reduce the normal load between the probe and the sample, as shown in Figure 4a. Regarding the structure and working principle of AFM, please refer to [32]. A high symmetry of rough peak height and density distributions is appropriate, because the established model of this study is based on the isotropy assumption of the Greenwood-Williamson random contact model.…”
Section: Sample Topography Parameter Measurementmentioning
confidence: 99%