From Hybrid to Integrated: The Evolution of DFT Integration in SoC Design at Intel

Pajak, Brian; Pant, Pankaj; Neerkundar, Vidya

doi:10.1109/itc51657.2024.00012

2024 IEEE International Test Conference (ITC) 2024

DOI: 10.1109/itc51657.2024.00012

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From Hybrid to Integrated: The Evolution of DFT Integration in SoC Design at Intel

Brian Pajak,

Pankaj Pant,

Vidya Neerkundar

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From Hybrid to Integrated: The Evolution of DFT Integration in SoC Design at Intel

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