2002
DOI: 10.1002/sia.1431
|View full text |Cite
|
Sign up to set email alerts
|

FTIR study of the electronic metal–support interactions on platinum dispersed on silica modified with titania

Abstract: Infrared spectroscopy, using carbon monoxide as probe molecule, was utilized to detect the electronic metal-support interactions on platinum dispersed on silica modified with different titania amounts. The spectral features produced by the electronic metal-support effects were observed only for the materials that present a high titania content and they are related to the crystal titania lattice.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

1
11
0
1

Year Published

2005
2005
2020
2020

Publication Types

Select...
9

Relationship

2
7

Authors

Journals

citations
Cited by 25 publications
(13 citation statements)
references
References 25 publications
1
11
0
1
Order By: Relevance
“…1(a,b), all of the other samples exhibited a similar amorphous peak at around 22.3 ( Fig. 1c-g), indicating that the amorphous structure was maintained (20).…”
Section: Results and Discussion Xrd And Tem Analysismentioning
confidence: 73%
“…1(a,b), all of the other samples exhibited a similar amorphous peak at around 22.3 ( Fig. 1c-g), indicating that the amorphous structure was maintained (20).…”
Section: Results and Discussion Xrd And Tem Analysismentioning
confidence: 73%
“…5 shows the X-ray diffraction results for the sample series. All the diffraction curves show a large peak, with angle 2θ near 20 • , which is characteristic of amorphous silica materials [49]. However, with the increasing of the organic content, two additional peaks were observed, starting from the X60 sample.…”
Section: Resultsmentioning
confidence: 97%
“…4 reveal that all the materials with 10° ≤ 2 θ ≤ 70° are totally amorphous, suggesting the noncrystalline state of the hybrids. All diffraction curves show similar broad peaks centered around 22°, which is attributed to the “amorphous hump” and it is a typical characteristic of amorphous silica backbone materials (35). For amorphous solids, the position of the first sharp diffraction peak can be related, via a reciprocal relation, to a distance in the real space between the structural units (Bragg law: 2dsin θ = nλ ).…”
Section: Resultsmentioning
confidence: 88%