Proceedings International Test Conference 1992 1992
DOI: 10.1109/test.1992.527817
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Functional and scan tests: The effectiveness of I/sub DDQ/ how many fault coverages do we need?

Peter Maxwell1,
V. Johansen2,
Inshen Chiang3
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Cited by 68 publications
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References 13 publications
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I DDQ Testing: A Review

Soden
1
,
Hawkins
2
,
Gulati
3
et al. 1992
IDDQ Testing of VLSI Circuits
80
0
13
0
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I DDQ Testing: A Review

Soden
1
,
Hawkins
2
,
Gulati
3
et al. 1992
IDDQ Testing of VLSI Circuits
80
0
13
0
View full textAdd to dashboardCite

I DDQ testing: A review

Soden
1
,
Hawkins
2
,
Gulati
3
et al. 1992
J Electron Test
145
0
15
0
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Quality-effective repair of multichip module systems

Park1,
Meyer2,
Lombardi3
2002
Journal of Systems Architecture
6
0
1
0
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