Functional Groups, Band Gap Energy, and Morphology Properties of Annealed Silicon Dioxide (SiO2)

Abstract

Annealed silicon dioxide (SiO2) has been prepared by various annealing temperatures at 0 (without treatment, room temperature), 800 °C, 900 °C and 1000 °C denote as S0, S800, S900 and S1000. The properties of the annealed SiO2 were characterized by three methods. The functional groups were identified using FTIR, the band gap energy was determined using UV-Vis DR, and the morphological properties of SiO2 were determined using SEM. FTIR data show that the characteristic functional groups of annealed silicon dioxide are Si−O−Si, Si−Si, −OH, H−Si−Si−H (monohydride), dan Si−OH. The band gap energy values for annealed SiO2 at S0, S800, S900 and S1000 were 2.27; 2.27; 2.26; 2.22 eV. The morphology of silicon dioxide shows that silicon dioxide has irregular shape and size, it has sharp angles accompanied by small flakes on the surface, the particle size is estimated to be around 3-10 μm.

Extraction of Novel Effective Nanocomposite Photocatalyst from Corn Stalk for Water Photo Splitting under Visible Light Radiation

“…From the literature, the band gap energies of CaCO 3 , MgCO 3 , and SiO 2 are 5.07, 5.14, and 2.26 eV, respectively [ 77 , 78 , 79 ]. The conduction and valence bands of the prepared nanoparticles’ functional constituents must be identified in order to comprehend the water splitting mechanism employing the suggested catalyst fully.…”