Functional Test of Field Programmable Analog Arrays

Balen, Tiago R.; Calvano, J.V.; Lubaszewski, Marcelo; Renovelf, M.

doi:10.1109/vts.2006.37

Cited by 11 publications

(5 citation statements)

References 5 publications

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“…In [9,10], the Transient Response Analysis Method (TRAM) is applied for testing the ispPAC10 device, by adopting a test circuit and the principle of redundancy-based test. The circuit for test response evaluation is implemented in another FPAA, incurring in high hardware overhead.…”

Section: Previous Work and Paper Contributionmentioning

confidence: 99%

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A low-cost configurability test strategy for an embedded analog circuit

Laprovitta

Peretti

Romero

et al. 2012

Microelectronics Journal

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Section: Previous Work and Paper Contributionmentioning

confidence: 99%

“…A proposal for testing FPAA interconnections between blocks is presented in [11,12], addressing a particular FPAA device from Anadigm. It should be noted that the test strategy cannot be applied to the device adopted as case study in [9,10]. Consequently, the configuration test for that device remains unsolved.…”

Section: Previous Work and Paper Contributionmentioning

confidence: 99%

A low-cost configurability test strategy for an embedded analog circuit

Laprovitta

Peretti

Romero

et al. 2012

Microelectronics Journal

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“…En (T.R. Balen et al, 2006) se plantea la posibilidad de realizar test de filtros pasabandas configurables a nivel de usuario, pero dicha posibilidad no es evaluada en el artículo.…”

Section: Introductionunclassified

Propuesta de test funcional para filtros pasabanda de capacidades conmutadas embebidos en sistemas en chip reconfigurables

Dri

Romero²,

Peretti³

2020

AJEA

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Este trabajo presenta una propuesta de test funcional para filtros de capacidades conmutadas pasabanda implementados sobre hardware configurable analógico de sistemas en chip de señales mixtas, basado en análisis de respuesta transitorio. El esquema propuesto incorpora la generación de estímulos dentro del mismo chip bajo test, reduciendo el instrumental requerido. La validación del esquema de test se realizó mediante simulación del entorno completo de prueba. Los resultados obtenidos son alentadores para la aplicación de la estrategia, habiéndose encontrado mínimas diferencias entre las especificaciones funcionales obtenidas por la estrategia y los valores de diseño

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“…The authors apply oscillation-based test (OBT) for testing the configurable blocks of the ispPAC10 device from lattice and propose a test response analyzer configured in the device, evaluating its fault detection ability through fault injection in the capacitors, switches, and input amplifiers. The transient response analysis method (TRAM) is applied for testing an ispPAC10 and another FPAA device from Anadigm in [9,10]. A proposal for testing FPAA interconnections between blocks is presented in [11,12], addressing a particular FPAA device from Anadigm.…”

Section: Introductionmentioning

confidence: 99%

Applying the Analog Configurability Test Approach in a Wireless Sensor Network Application

Laprovitta

Peretti

Romero

2014

Journal of Electrical and Computer Engineering

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This work addresses the application of the analog configurability test (ACT) approach for an embedded analog configurable circuit (EACC), composed of operational amplifiers and interconnection resources that are embedded in the MSP430xG461x microcontrollers family. This test strategy is particularly useful for in-field application requiring reliability, safe operation, or fault tolerance characteristics. Our test proposal consists of programming a reduced set of available configurations for the EACC and testing its functionality by measuring only a few key parameters. The processor executes an embedded test routine that sequentially programs selected configurations, sets the test stimulus, acquires data from the internal ADC, and performs required calculations. The test approach is experimentally evaluated using an embedded system-based real application board. Our experimental results show very good repeatability, with very low errors. These results show that the ACT proposed here is useful for testing the functionality of the circuit under test in a real application context by using a simple strategy at a very low cost.

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Functional Test of Field Programmable Analog Arrays

Cited by 11 publications

References 5 publications

A low-cost configurability test strategy for an embedded analog circuit

A low-cost configurability test strategy for an embedded analog circuit

Propuesta de test funcional para filtros pasabanda de capacidades conmutadas embebidos en sistemas en chip reconfigurables

Applying the Analog Configurability Test Approach in a Wireless Sensor Network Application

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