Further Applications of Kikuchi Diffraction Patterns; Kikuchi Maps

Abstract

Composite Kikuchi electron diffraction patterns have been obtained which map out reciprocal space for silicon over the 〈001–011–111〉 stereographic triangle. These maps enable unknown diffraction patterns to be quickly solved even when they do not contain any Kikuchi poles. Unlike spot patterns, the Kikuchi patterns and maps uniquely represent the crystal symmetry. Some applications of these maps in crystallographic and electron microscopy investigations are discussed.

Local Crystal Misorientation Influences Non-radiative Recombination in Halide Perovskites

“…Kikuchi diffraction lines generated at local Bragg angles contain the information about the local crystal orientation. 33,34 We scan across the sample and collect these Kikuchi patterns at every pixel and generate a local crystal orientation map of CH3NH3PbI3 thin film. Figure 1a shows an SEM image of a representative CH3NH3PbI3 thin film grown by lead acetate and methylammonium based precursors with hypophosphorous acid additives (a recipe used for CH3NH3PbI3-based photovoltaics, see Experimental Procedures for details) 35 and corresponding sharp Kikuchi patterns obtained at 6 kV, 10 kV and 20 kV.…”

Pseudo-monocrystalline properties of cylindrical nanowires confinedly grown by electrodeposition in nanoporous alumina templates

“…explored tilt angle ranges, the incident electron beam did not reach the points at which the Kikuchi lines converged, which were associated with zone axes. 70 On the other hand, the points of the reciprocal lattice space were rather elongated due to the occurrence of stacking faults and can intercept the Ewald sphere even at large angles away from a zone axis. This fact led to diffraction spots in the SAED patterns, with unusual dependences on the abovementioned tilting angles.…”

Kikuchi bands in quasicrystals and their approximants

“…Kikuchi bands (Kikuchi 1928, Reimer et al 1986, Reimer 1989, Williams and Carter 1996, most easily observed in the transmission electron microscope in its convergent-beam electron diffraction (CBED) mode, make possible the determination of angles between high symmetry zone axes more accurately than is possible from goniometer readings alone (Levine et al 1966, Okamoto et al 1967, Daulton et al 1991. They also make the alignment of a zone axis with the beam direction a straightforward task.…”