2019
DOI: 10.1016/j.apsusc.2019.03.074
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Further optimization of ITO films at the melting point of Sn and configuration of Ohmic contact at the c-Si/ITO interface

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Cited by 25 publications
(7 citation statements)
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“…The opto-electrical performances of our electrodes are at the-state-of-the-art of this ETC field [26]. With a fairly large merit figure comparable to literature values [23,[27][28][29], such transparent, conductive three-layer electrodes are good candidates for use as indium-free electrode in organic solar cells.…”
Section: Numerical and Experimental Methodssupporting
confidence: 63%
“…The opto-electrical performances of our electrodes are at the-state-of-the-art of this ETC field [26]. With a fairly large merit figure comparable to literature values [23,[27][28][29], such transparent, conductive three-layer electrodes are good candidates for use as indium-free electrode in organic solar cells.…”
Section: Numerical and Experimental Methodssupporting
confidence: 63%
“…An ITO layer was deposited on the Si-NW shells as a transparent conducting oxide (TCO) top layer for better charge collection across the p - i - n heterojunction. The material properties (e.g., transparency, conductivity) of the TCO layer have been optimized earlier . The ITO layer and the finger-grid front and rear metal electrodes make the complete Si-NW array solar cell.…”
Section: Results and Discussionmentioning
confidence: 57%
“…The freshly prepared chemically etched n -type c-Si-NWs samples were immediately transferred into an RF-PECVD chamber, where the NW surface was cleaned by a rapid in situ H 2 plasma treatment for 3 min. The different layers of the proposed Si-NW HJSCs were grown based on detailed characterization of the material done in our several previous publications and its use in the fabrication of solar cells. The growth conditions are listed in Table .…”
Section: Methodsmentioning
confidence: 99%
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“…The scanned area was 900 μm 2 but obtained areas were more than 900 μm 2 which confirmed roughened surface of the samples. The surface areas of samples S2, S3, S5, and S6 are 1417, 1382, 1355, and 1267 μm 2 , respectively which indicate their roughness 26 …”
Section: Resultsmentioning
confidence: 99%