Abstract:Cd 0.9 Zn 0.1 Te (CZT) single crystal has been grown using a tellurium solvent method. Two CZT crystals have been chosen from two different locations of the grown ingot. The two crystals were characterized using infrared transmission (IR) imaging and radiation detectors in planar geometry were fabricated on them. Current-voltage characteristics (I-V) revealed a resistivity of ~8.6×10 10 cm for detector A (6.9×6.9×4.8 mm 3 ) and 6.7×10 10 cm for detector B (11.5×11.7×2.6 mm 3 ). IR imaging showed a lesser conce… Show more
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