2004 Electrical Overstress/Electrostatic Discharge Symposium 2004 Help me understand this report
Gate oxide failures due to anomalous stress from HBM ESD testers
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Cited by 13 publications
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“…[1,2,3,4]. These phenomena may, in particular, influence HBM test results of active clamps [5,6], which are widely used in rail-based protection strategies.…”
Section: Introductionmentioning
confidence: 99%
“…[1,2,3,4]. These phenomena may, in particular, influence HBM test results of active clamps [5,6], which are widely used in rail-based protection strategies.…”
Section: Introductionmentioning
confidence: 99%
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