2024
DOI: 10.1109/tim.2023.3329163
|View full text |Cite
|
Sign up to set email alerts
|

Generative and Contrastive Combined Support Sample Synthesis Model for Few-/Zero-Shot Surface Defect Recognition

Yuran Dong,
Cheng Xie,
Luyao Xu
et al.

Abstract: Surface defect detection is one of the most important vision-based measurements for intelligent manufacturing. Existing detection methods mainly require massive numbers of defect samples to train the model to detect the defects. Nowadays, inadequate defect samples and labels are inevitably encountered in industrial data environments due to the highly automated and stable production lines escalatingly deployed, causing fewer and fewer defective products to be produced. Consequently, manual interventions are dee… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 64 publications
(74 reference statements)
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?