“…Energy dispersive spectroscopy (EDS) measurements acquired from the XTEM sample, both before and after annealing, indicate that a significant amount of Ga was present within the carbon film prior to heating and in the droplets observed post-annealing after air-exposure. EDS data also indicated a significant fraction of oxygen but this is likely due to air exposure and not expected in the droplets since gallium oxide does not melt at 773 K. The presence of carbon, if any, 19,[21][22][23] within the droplets could not be determined accurately from EDS due to the large background signal of carbon from the surrounding region. This procedure of forming Ga droplets is highly reproducible and we have obtained similar results, i.e., Ga droplets on carbon films on FIB-prepared XTEM samples of C/Ti/Si, Zr/Al 2 O 3 (0001), and bare Al 2 O 3 (0001) substrates.…”