Growth Pattern Study of Closed Surface Flaw under Compression

Guo, Y.S.H.; Zhu, Wei Shen; Li, Shu Cai; Wong, R.H.C.; Sin, B.

doi:10.4028/0-87849-456-1.158

Key Engineering Materials

2007

DOI: 10.4028/0-87849-456-1.158

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Growth Pattern Study of Closed Surface Flaw under Compression

Y.S.H. Guo¹,

Wei Shen Zhu²,

Shu Cai Li³

et al.

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Growth Pattern Study of Closed Surface Flaw under Compression

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