Hard X-ray nanoprobe at beamline P06 at PETRA III

Abstract

Abstract.The hard x-ray scanning microscope at beamline P06 of PETRA III at DESY in Hamburg serves a large user community, from physics, chemistry, and nanotechnology to the bio-medical, materials, environmental, and geosciences. It has been in user operation since 2012, and is mainly based on nanofocusing refractive x-ray lenses. Using refractive optics, nearly gaussian-limited nanobeams in the range from 50 to 100 nm can be generated in the hard x-ray energy range from 8 to 30 keV. The degree of coherence can be traded off against the flux in the nanobeam by a two-stage focusing scheme. We give a brief overview on published results from this instrument and describe its most important components and parameters.

PtyNAMi: Ptychographic Nano-Analytical Microscope at PETRA III: interferometrically tracking positions for 3D x-ray scanning microscopy using a ball-lens retroreflector

“…The x-ray scanning microscope (nanoprobe) 16,17 at beamline P06 was commissioned in 2011 and went into user operation at the beginning of 2012. It was designed based on nanofocusing refractive x-ray lenses (NFLs) 20,21 and is located at about 98 m from the source.…”

“…The transverse coherence length of the beam is matched to the aperture by a set of refractive x-ray lenses made of beryllium located at 43.5 m from the source. 17 They create a (sometimes virtual) secondary source along the beamline and allow various modes of operation: 16 • A high-coherence mode, for which the lateral coherence length is made much larger than the aperture of the nanofocusing optics. In this mode, a high lateral coherence is achieved at the expense of flux.…”

“…A pair of slits defines the entrance aperture of the optics and a pinhole behind the lenses cleans the focused beam from scattered radiation. 17 As the imaging geometries and the requirements for their alignment are very similar for Fresnel zone plates (FZP) and multi-layer Laue lenses (MLL), these optics can also be used in the scanning microscope. [22][23][24][25] In order to exploit the various x-ray analytical contrasts, a series of different detectors are employed: an energy dispersive detector (silicon drift diode, Vortex-EM from Hitatchi), various photon-counting pixel detectors for SAXS and WAXS measurements (Pilatus 300k from Dectris, Lambda 750k from X-Spectrum, and since recently an Eiger X 4M from Dectris), a high-resolution x-ray camera (Optique-Peter microscope combined with a PCO.4000 from PCO), and a calibrated PIN-Diode (Hamamatsu).…”

“…14,15 In recent years this technique has developed into a routine x-ray microscopy technique available at various synchrotron radiation sources, including the hard x-ray nanoprobe station of beamline P06 at PETRA III. 16,17 In this scanning microscopy technique, a coherent far-field diffraction pattern of the illuminated region on the sample is recorded at each scan point. From these data and the knowledge of their relative scanning positions, the complex transmission function (integral of the complex refractive index along the beam direction) can be reconstructed together with the complex wave field at the sample position using phase retrieval algorithms.…”

Maia X-ray fluorescence imaging: Capturing detail in complex natural samples

“…This paper will also present new improvements in Maia technology that are benefitting XFM analysis at the P06 beamline [3] at Petra III in Germany, which uses a new version of Maia with improved energy resolution. It also provides a discussion of the advantages and drawbacks of the annular geometry.…”