2023 IEEE International Test Conference India (ITC India) 2023
DOI: 10.1109/itcindia59034.2023.10235396
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Hidden in Plain Sight: A Detailed Investigation of Selectively Increasing Local Density to Camouflage and Robustify Against Optical Probing Attacks

Sajjad Parvin,
Chandan Kumar Jha,
Sallar Ahmadi-Pours
et al.
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