Hierarchical simulation approach to accurate fault modeling for system dependability evaluation

Kalbarczyk, Zbigniew; Iyer, Ravishankar K.; Ries, G.; Patel, J.; Lee, M.S.; Xiao, Yang

doi:10.1109/32.815322

Cited by 35 publications

(21 citation statements)

References 10 publications

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“…There are a number of programs and tools for efficient fault injection [2,7,10,22,24,26,28,31,35,43,45,49,55,56]. There are efforts to model fault propagation and effect [5,7,12,17,19,22,23,27,28,30,32,36,38,39,40,41,44,45,47,50,52]. Coverage is a popular topic, and the meaning of coverage can vary from simple detection to complete system recovery and reconfiguration [1,2,3,4,5,10,11,12,15,16,17,18,20,21,27,29,…”

Section: Literature Surveymentioning

confidence: 99%

“…There are efforts to model fault propagation and effect [5,7,12,17,19,22,23,27,28,30,32,36,38,39,40,41,44,45,47,50,52]. Coverage is a popular topic, and the meaning of coverage can vary from simple detection to complete system recovery and reconfiguration [1,2,3,4,5,10,11,12,15,16,17,18,20,21,27,29,31,33,36,37,38,39,40,41,42,43,44,54,55]. There are papers about the efficient estimation of coverage [15,…”

Section: Literature Surveymentioning

confidence: 99%

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Designing fault-injection experiments for the reliability of embedded systems

White

2012

2012 IEEE/AIAA 31st Digital Avionics Systems Conference (DASC)

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This paper considers the long-standing problem of conducting fault-injections experiments to establish the ultra-reliability of embedded systems. There have been extensive efforts in fault injection, and this paper offers a partial summary of the efforts, but these previous efforts have focused on realism and efficiency. Fault injections have been used to examine diagnostics and to test algorithms, but the literature does not contain any framework that says how to conduct fault-injection experiments to establish ultra-reliability. A solution to this problem integrates field-data, arguments-from-design, and fault-injection into a seamless whole. The solution in this paper is to derive a model reduction theorem for a class of semi-Markov models suitable for describing ultra-reliable embedded systems. The derivation shows that a tight upper bound on the probability of system failure can be obtained using only the means of system-recovery times, thus reducing the experimental effort to estimating a reasonable number of easily-observed parameters. The paper includes an example of a system subject to both permanent and transient faults. There is a discussion of integrating fault-injection with fielddata and arguments-from-design.

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Section: Literature Surveymentioning

confidence: 99%

Section: Literature Surveymentioning

confidence: 99%

Designing fault-injection experiments for the reliability of embedded systems

White

2012

2012 IEEE/AIAA 31st Digital Avionics Systems Conference (DASC)

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“…In the second step, the raw probabilities are derated and combined [43], [44]. From a user's perspective, we have to differentiate between the detected and corrected errors, the detected and uncorrected errors, and the undetected errors [45].…”

Section: Block-level Impactmentioning

confidence: 99%

“…In a combinational circuit, a single particle strike can affect multiple outputs because the induced transient can propagate through multiple combinational logic paths and get latched at multiple locations. Various studies have been performed to quantify the effect of one strike that affects multiple bits [43], [44].…”

Section: Block-level Impactmentioning

confidence: 99%

Characterization of soft errors caused by single event upsets in CMOS processes

Karnik

Hazucha

2004

IEEE Trans.Dependable and Secure Comput.

447

211

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Abstract-Radiation-induced single event upsets (SEUs) pose a major challenge for the design of memories and logic circuits in highperformance microprocessors in technologies beyond 90nm. Historically, we have considered power-performance-area trade offs. There is a need to include the soft error rate (SER) as another design parameter. In this paper, we present radiation particle interactions with silicon, charge collection effects, soft errors, and their effect on VLSI circuits. We also discuss the impact of SEUs on system reliability. We describe an accelerated measurement of SERs using a high-intensity neutron beam, the characterization of SERs in sequential logic cells, and technology scaling trends. Finally, some directions for future research are given.

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“…A hierarchical fault modeling approach for system dependability evaluation has been developed by Iyer et al [6]. In this technique, the effects of low-level faults (transistor or chip level) are propagated to higher levels (system level) using fault dictionaries.…”

Section: Introductionmentioning

confidence: 99%

Dependency Analysis in Distributed Systems using Fault Injection: Application to Problem Determination in an e-commerce Environment

Bagchi¹,

Kar²,

Hellerstein³

2001

Operations &Amp; Management: 12th International Workshop on Distributed Systems, DSOM 2001, Nancy, France, October 15-17, 2001:

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Distributed networked applications that are being deployed in enterprise settings, increasingly rely on a large number of heterogeneous hardware and software components for providing end-to-end services. In such settings, the issue of problem diagnosis becomes vitally important, in order to minimize system outages and improve system availability. This motivates interest in dependency characterization among the different components in distributed application environments. A promising approach for obtaining dynamic dependency information is the Active Dependency Discovery technique in which a dependency graph of e-commerce transactions on hardware and software components in the system is built by individually "perturbing" the system components during a testing phase and collecting measurements corresponding to the external behavior of the system.In this paper, we propose using fault injection as the perturbation tool for dynamic dependency discovery and problem determination. We describe a method for characterizing dependencies of transactions on the system resources in a typical e-commerce environment, and show how it can aid in problem diagnosis. The method is applied to an application server middleware platform, running end-user activity composed of TPC-W transactions. Representative fault models for such an environment, that can be used to construct the fault injection campaign, are also presented.

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Hierarchical simulation approach to accurate fault modeling for system dependability evaluation

Cited by 35 publications

References 10 publications

Designing fault-injection experiments for the reliability of embedded systems

Designing fault-injection experiments for the reliability of embedded systems

Characterization of soft errors caused by single event upsets in CMOS processes

Dependency Analysis in Distributed Systems using Fault Injection: Application to Problem Determination in an e-commerce Environment

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