High-Density Near-Field Optical Disc Recording

Shinoda, Masataka; Saito, Kimihiro; Ishimoto, Tsutomu; Kondo, Takao; Nakaoki, Ariyoshi; Ide, Naoki; Furuki, Motohiro; Takeda, Minoru; Akiyama, Yuji; Shimouma, Takashi; Yamamoto, Masanobu

doi:10.1143/jjap.44.3537

Cited by 52 publications

(40 citation statements)

References 19 publications

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“…[2][3][4][5][6][7][8][9][10][11][12][13][14][15][16] It can exhibit a large capacity and a highdata transfer rate towards recording next-generation ultrahigh-definition television [i.e., Super Hi-Vision (SHV), 7320 Â 4320 pixels] video signals 17,18) for home-use. Fourfold higher density recording using NFR optical disks with 1.2-mm-thick disks has been reported, 12,14) and studies of larger capacity using multilayer recording using NFR have been reported.…”

Section: Introductionmentioning

confidence: 99%

Recording characteristics of high-density thin optical disk using near-field optical recording

Koide

Kajiyama

Sato

et al. 2014

OPT REV

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We report on the recording characteristics of a near-field optical recording thin optical disk (NFR-TOD). We proposed a new cooling-less-type write strategy for recording, applied it to the NFR-TOD experimental system, and also applied a partial response maximum likelihood (PRML) signal processing, which was evaluated and optimized the PR coefficient for playback signals of the prototype NFR-TOD. The NFR-TOD has a track pitch of 160 nm and improved recording characteristics. The experimental results of the prototype NFR-TOD and the system indicate sufficiently low bit error rates (bERs) for recorded data at a fourfold higher recording density than the current Blu-ray disk.

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Section: Introductionmentioning

confidence: 99%

Recording characteristics of high-density thin optical disk using near-field optical recording

Koide

Kajiyama

Sato

et al. 2014

OPT REV

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“…Among those, the memory capacity is one of the most important, which is determined in principle by a mark size. In optical phase-change systems such as DVD-RAM, the size is greater than ~100 nm in diameter, which is governed by diffraction or evanescent-wave characters of laser light [1,2]. Nevertheless, recording materials, e.g.…”

Section: Introductionmentioning

confidence: 99%

Smallest (∼10nm) phase-change marks in amorphous and crystalline Ge2Sb2Te5 films

Tanaka

2007

Journal of Non-Crystalline Solids

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Electrical nano-scale crystallization and amorphization in amorphous and crystalline Ge 2 Sb 2 Te 5 films have been studied using scanning probe microscopes. In scanning tunneling microscopes, the phase changes can be induced, not by tunneling currents, but by conducting currents flowing through contacted probes. In an atomic force microscope, metallic cantilevers can produce phase-change marks with minimal sizes of ~10 nm. The crystallization and amorphization processes show different dependences upon thickness of Ge 2 Sb 2 Te 5 films. These features are discussed from thermo-dynamical and microscopic structural points-of-view.

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“…However, recently, some research institutions achieved a robust control maintaining gap distance between the media and SIL below 20 nm (Lee et al 2005;Ishimoto et al 2003). With this stable nearfield gap servo system, they showed some practical results using the super-hemispherical SIL to have 100 Gbytes per 1 layer on 12 cm disc with extremely high numerical aperture (NA) 1.8 (Shinoda et al 2005). However, in the NFR optics using the super-hemispherical SIL, there is another critical problem in the fabrication of the SIL, because geometry of the superhemispherical SIL yields tight center thickness tolerance below 0.5 lm under the criterion of wavefront aberration below 0.035 krms (Zijp et al 2006).…”

Section: Introductionmentioning

confidence: 99%

Thickness tolerance compensation of SIL first surface near-field recording with replicated lens on SIL

et al. 2007

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In this paper, we propose a novel optics design for improving the thickness tolerance of a super-hemispherical solid immersion lens (SIL) that is usually used in near-field recording for high data density. To obtain the improved thickness tolerance of a SIL and a high numerical aperture simultaneously, an aspheric replicated lens is added on the SIL. Using an additional aspheric replicated lens, spherical aberration which induces the tight thickness tolerance of the SIL is effectively reduced, therefore it was able to improve the thickness tolerance of the SIL, maintaining high NA equal to that of super-hemispherical SIL. In addition, in this paper, other various tolerances such as decenter and tilt are considered to make sure of the possibility of fabrication.

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High-Density Near-Field Optical Disc Recording

Abstract: Following [6] relating the matrix string theory to the light-cone superstring field theory, we write down two supercharges in the matrix string theory explicitly. After checking the supersymmetry algebra at the leading order, we proceed to discuss higherorder contact terms.

Cited by 52 publications

References 19 publications

Recording characteristics of high-density thin optical disk using near-field optical recording

Recording characteristics of high-density thin optical disk using near-field optical recording

Smallest (∼10nm) phase-change marks in amorphous and crystalline Ge2Sb2Te5 films

Thickness tolerance compensation of SIL first surface near-field recording with replicated lens on SIL

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