High-quality quartz single crystals for high-energy-resolution inelastic X-ray scattering analyzers

Abstract

Spherical analyzers are well known instruments for inelastic X-ray scattering (IXS) experiments. High-resolution IXS experiments almost always use Si single crystals as monochromators and spherical analyzers. At higher energies (>20 keV) Si shows a high energy resolution (<10 meV), at an exact symmetric back-diffraction condition, since the energy resolution is given by the real part of the susceptibility or polarizability. However, at low energies (<10 keV), high energy resolution is difficult to achieve with Si. -SiO 2 (quartz) can be an option, since it offers high energy resolution at low energies. In this work, the characterization of high-quality -SiO 2 is presented. Such characterization is made by high-resolution rocking curve, topography and lattice parameter mapping in different samples from a single block. X-ray optics with -SiO 2 for IXS at lower energies (from 2.5 to 12.6 keV) with medium to high energy resolution (from 90 to 11 meV) are proposed and theoretically exploited.

Construction of a quartz spherical analyzer: application to high-resolution analysis of the NiKα emission spectrum

“…In fact, sapphire has been used for making IXS spherical analyzers (Yavaş et al, 2007;Sergueev et al, 2011). Quartz and LiNbO 3 spherical analyzers have also been proposed for IXS studies, since they offer high energy resolution at lower photon energies (Sutter et al, 2005(Sutter et al, , 2006Gog et al, 2013;Hö nnicke et al, 2013;Ketenoglu et al, 2015). One of the main motivations for the development of quartz-based spherical analyzers is that they offer a large choice of reflections within a given photon energy interval owing to the lower crystal symmetry with respect to silicon or germanium.…”

Exotic X-ray back-diffraction: a path toward a soft inelastic X-ray scattering spectrometer

“…These properties, combined with the development of high-brilliance and lowemittance X-ray sources, make XBD attractive for studying thermal expansion and lattice parameters at different temperatures of different types of single crystals (Wille et al, 2002;Lucht et al, 2003;Giles et al, 2005;Stoupin & Shvyd'ko, 2010;Stoupin & Shvyd'ko, 2011). XBD can also be employed for building ultra-high-energy-resolution X-ray mono-chromators and analyzers for inelastic X-ray scattering (IXS) involving different types of single crystals (Cai et al, 2004;Sutter et al, 2005Sutter et al, , 2006Hill et al, 2007;Sergueev et al, 2011;Hö nnicke, Huang et al, 2013) and/or exotic geometries (Shvyd'ko et al, 2006;Huang, 2011;Stetsko et al, 2011;Stoupin et al, 2013). Other applications range from Fabry-Perrot X-ray interferometers (Shvydko et al, 2003;Chang et al, 2005;Huang et al, 2012) to imaging applications (Hö nnicke et al, 2008;Honnicke & Cusatis, 2009;Huotari et al, 2011).…”

“…This effect reduces the back-diffracted X-ray beam intensity and is also responsible for the reduction of contrast in X-ray Fabri-Perot interferometers. One way to minimize MBD is to select reflections in noncentrosymmetric crystals such as sapphire or quartz (Sergueev et al, 2011;Sutter et al, 2005Sutter et al, , 2006Hö nnicke, Huang et al, 2013). Another way to minimize, or even avoid, MBD is to work with low-order diffraction planes.…”

X-ray back-diffraction: can we further increase the energy resolution by tuning the energy slightly below that of exact backscattering?

“…3) was oriented and cut by a dicing saw with a metal-bonded diamond blade into a slab with dimensions of 33 Â 38 Â 3 mm from a grade A -SiO 2 singlecrystal block (TEW Japan). Grade B (Sutter et al, 2005) and grade A (Sutter et al, 2006;Hö nnicke et al, 2013;Ketenoglu et al, 2015;Huang et al, 2018, Macrander et al, 2019 -SiO 2 single crystals (TEW Japan) have been previously characterized and it was found that the relative variations in the lattice parameters (Ád/d) are smaller than 1 Â 10 À7 for the grade A research papers DuMond diagrams (DuMond, 1937) used to estimate the divergence and bandwidth obtained with the Si 220 MBBM. (a) DuMond diagram overview for the InSb 111 DCM and the MBBM showing the region of exact XBD where the energy resolution (Á/) appears infinitely small.…”

“…Our goal is to determine whether the energy resolution under such extreme conditions can be further improved in comparison with that for the exact XBD condition. For this purpose, the XBD h-beam is characterized by using a grade A high-quality -SiO 2 1120 single crystal (TEW, Japan) (Sutter et al, 2006;Hö nnicke et al, 2013Hö nnicke et al, , 2016Ketenoglu et al, 2015;Yavaş et al, 2017;Gog et al, 2018;Kim et al, 2018;Huang et al, 2018;Said et al, 2018, Macrander et al, 2019 as the analyser at energies around 3.2 keV.…”