1993
DOI: 10.1016/0168-583x(93)95539-h
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High resolution imaging with high energy ion beams

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Cited by 43 publications
(2 citation statements)
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“…There are several methods to measure a beam profile [2,6,7] . However none of them is suitable for SIM because SIM emits only several ions each time.…”
Section: The Beam Spot Radiusmentioning
confidence: 99%
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“…There are several methods to measure a beam profile [2,6,7] . However none of them is suitable for SIM because SIM emits only several ions each time.…”
Section: The Beam Spot Radiusmentioning
confidence: 99%
“…It is required to eliminate all possible influential factors in order to get such spots in microns. The beam energy instability is one of the most serious factors [2] which causes a wider beam spot and a shorter running time, and may even render the microbeam unable to work. Reducing the radius of the beam spot so as to improve the positioning precision is the key point for SIM development.…”
Section: Introductionmentioning
confidence: 99%