High resolution PIXE instrumentation survey. Part III

Dependence of relative intensity of L1 sub-shell X-rays on ion beam energy

“…Nevertheless, the use of other X-ray lines still remains significantly unexplored, although it is presently well known that information on the electronic environment of the radiating ion is present therein [3][4][5][6][7] and, furthermore, a proper accounting for the intensity of these other lines may be essential to achieve a correct quantification of all elements present in a sample. Several reasons can justify discrepancies between experimental and theoretical values.…”

High resolution energy dispersive spectrometry (HiREDS), a new tool for X-ray emission work

“…Petukhov, Terasawa and Török compiled reviews on the spread of the use of these type of spectrometers on HR-PIXE work until 1996. 16–18 On counting at that date there were a total of 22 laboratories using it for: (a) elemental analysis (24 references); (b) chemical state analysis (44 references) and (c) basic research (46 references). WDS systems still keep a standard rate of publication in these same areas and the more recent studies by Kavčič, 19–21 Kertész, 22 Hasegawa, 23 Maeda, 24 Tada, 25,26 Woo 27 and Cureatz, 28 to point out just a very few, are good examples.…”

Foundations and trends of high resolution energy dispersive PIXE (HiRED-PIXE)

“…Since then, this type of work was never abandoned, although it remained for a long time limited to a few laboratories around the world, and oriented mostly towards fundamental problems. Comprehensive reviews of the work of various laboratories in this context were published by Terasawa, Torök and Petukhov in the 1990s [4][5][6]. After the turn of the century, using WDS high resolution PIXE for applications became more frequent.…”