High resolution spectroscopy to investigate impurity traces in YAB single crystals

Abstract

The work explores the feasibility of high resolution (as fine as 0.02 cm -1 ) Fourier transform spectroscopy applied at 9 K in the 500-25000 cm -1 range to detect traces of unwanted impurities, mainly rare earths (RE 3+ ) in crystals: the system chosen is YAl 3 (BO 3 ) 4 (YAB). Weak traces of RE 3+ (Nd, Dy, Er, Tm, Yb), but also of Cr 3+ and OH -, were successfully monitored by comparing the spectra of YAB samples under examination with those intentionally doped with a given ion. The analysis performed on a variety of samples shows how Cr 3+, Nd 3+, and Yb 3+ are the most frequent unwanted dopants and can provide suggestions to the crystal growers about the performances of different crystal growth lines. According to a preliminary evaluation, the Er 3+ traces detection limit is as low as 1-2×10 -4 mol% in 1 cm thick samples. The advantages of the method, which is sample non-destructive, are discussed in comparison with those currently applied.