High-resolution synchrotron diffraction study of porous buffer InP(001) layers

Lomov, A. A.; Пунегов, В. И.; Nohavica, D.; Чуев, М. А.; Vasiliev, Alexander L.; Novikov, D. V.

doi:10.1107/s1600576714016392

Cited by 15 publications

(10 citation statements)

References 51 publications

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“…Chaotically distributed spherical clusters 24 and correlated dislocations 25 are also still attractive objects of research. Other interesting objects for application of statistical diffraction approaches are crystallographic systems with included nanoclusters 26 , porous structures 27 , crystals having a net of periodic dislocations 28 or a periodic domain structure 29 . BCDI avoids such an averaging over the illumination volume, demonstrated by standard methods of high resolution X-ray diffractometry (see e.g., ref.…”

Section: Introductionmentioning

confidence: 99%

Deterministic Bragg Coherent Diffraction Imaging

Pavlov

Пунегов

Morgan

et al. 2017

Sci Rep

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A deterministic variant of Bragg Coherent Diffraction Imaging is introduced in its kinematical approximation, for X-ray scattering from an imperfect crystal whose imperfections span no more than half of the volume of the crystal. This approach provides a unique analytical reconstruction of the object’s structure factor and displacement fields from the 3D diffracted intensity distribution centred around any particular reciprocal lattice vector. The simple closed-form reconstruction algorithm, which requires only one multiplication and one Fourier transformation, is not restricted by assumptions of smallness of the displacement field. The algorithm performs well in simulations incorporating a variety of conditions, including both realistic levels of noise and departures from ideality in the reference (i.e. imperfection-free) part of the crystal.

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Section: Introductionmentioning

confidence: 99%

Deterministic Bragg Coherent Diffraction Imaging

Pavlov

Пунегов

Morgan

et al. 2017

Sci Rep

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“…that have left their coherent positions (Lomov et al, 2014;Punegov, 2013). Now, taking into account that the diffraction peaks for pSi are intense and their corresponding FWHMs are fairly narrow, close to the FWHM of cSi, indicating that X-rays scatter dynamically, we can consider that the Debye-Waller factor f s for the remaining crystallites is close to unity.…”

Section: Research Papersmentioning

confidence: 99%

“…In addition to the coherent scattering, a transverse streak is observable, determined by the X-ray diffuse scattering occurring in the porous structure [this region is marked with orange dashed lines in the (004) RSM graphs]. Distinctive sharp streaks are also present due to the Bragg diffraction and the experimental scheme used (Lomov et al, 2014).…”

Section: Research Papersmentioning

confidence: 99%

“…Accordingly, the diffuse scattering width, Á!, has the following values: 0.0099, 0.012, 0.0090 and 0.011 Å À1 , resulting in the characteristic sizes 10.1, 8.3, 11.1 and 9 nm for S1, S2, S3, S4, respectively. Since the diffuse scattering is mainly determined by pores, the contribution from crystallites is minor in this case; thus the characteristic size can be interpreted as the mean pore diameter (Lomov et al, 2014).…”

Section: Research Papersmentioning

confidence: 99%

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X-ray scattering profiles: revealing the porosity gradient in porous silicon

et al. 2021

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Porous silicon layers with different porosities were prepared by adjusting the anodization current density of the electrochemical etching process, starting from highly doped p-type crystalline silicon wafers. The microstructural parameters of the porous layers were assessed by high-resolution X-ray diffraction, total external reflection, scanning electron microscopy and nitrogen adsorption–desorption analysis. Furthermore, both the surface porosity and the mean porosity for the entire volume of the samples were estimated by employing total external reflection measurements and X-ray reciprocal-space mapping, respectively. The results clearly indicate that the surface porosity is different from the mean porosity, and the presence of a depth porosity gradient is suggested. To evaluate the porosity gradient in a nondestructive way, a new laboratory method using the grazing-incidence X-ray diffraction technique is reported. It is based on the analysis of the X-ray scattering profiles of the porous layers to obtain the static Debye–Waller factors. In this way, a description of the porosity gradient in a quantitative framework becomes possible, and, as a result, it was shown that the porosity increases exponentially with the X-ray penetration depth. Moreover, a strong dependence between the porosity gradient and the anodization current was demonstrated. Thus, in the case of the lowest anodization current (e.g. 50 mA cm−2) a variation of only 15% of the porosity from the surface to the interface is found, but when applying a high anodization current of 110 mA cm−2 the porosity close to the bulk interface is almost three times higher than at the surface.

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“…Recently, triple-crystal X-ray diffraction (Iida & Kohra, 1979;Zaumseil & Winter, 1982) has been successfully applied to investigate a variety of crystalline structures (Bhagavannarayana & Zaumseil, 1997;Kazimirov et al, 1990;Faleev et al, 2013;Lomov et al, 2014;Punegov, 2015) and X-ray optical elements (Jergel et al, 1999;Irzhak et al, 2015). Despite the fact that diffracted waves contain both coherent and diffuse scattered components, typically only the latter, caused by scattering on defects, is analysed, often only qualitatively.…”

Section: Introductionmentioning

confidence: 99%

Applications of dynamical theory of X-ray diffraction by perfect crystals to reciprocal space mapping

et al. 2017

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The classical dynamical theory of X-ray diffraction is expanded to the special case of transversely restricted wavefronts of the incident and reflected waves. This approach allows one to simulate the two-dimensional coherently scattered intensity distribution centred around a particular reciprocal lattice vector in the so-called triple-crystal diffraction scheme. The effect of the diffractometer's instrumental function on X-ray diffraction data was studied.research papers

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High-resolution synchrotron diffraction study of porous buffer InP(001) layers

Cited by 15 publications

References 51 publications

Deterministic Bragg Coherent Diffraction Imaging

Deterministic Bragg Coherent Diffraction Imaging

X-ray scattering profiles: revealing the porosity gradient in porous silicon

Applications of dynamical theory of X-ray diffraction by perfect crystals to reciprocal space mapping

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