2000
DOI: 10.1088/0034-4885/63/10/203
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High-resolution x-ray scattering measurements: I. Surfaces

Abstract: X-ray scattering investigations of surfaces and interfaces in soft-condensed matter are reviewed. Both high-resolution structural determinations in the direct space and investigations of fluctuations with long-range correlations requiring a high resolution in the Fourier space are discussed. All the scattering cross-sections for diffraction or diffuse scattering are derived within a unified frame, and the experimental aspects related to their measurement are discussed in detail. The general principles are illu… Show more

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Cited by 84 publications
(71 citation statements)
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References 267 publications
(413 reference statements)
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“…We then treat the bilayer as a weak perturbation. 53 Within this approximation, the diffuse scattering cross section ͑intensity scattered per unit solid angle ⍀ in the direction k sc per unit of incident flux in the direction k in ͒ ͑see Fig. 15͒ 20,54 This perturbation is related to the electronic density correlation function ͗␦͑r͒␦͑rЈ͒͘ and originates from electrondensity lateral heterogeneities: this can, for instance, result from the presence of pores 55 or domains after phase separation.…”
Section: Direct Study Of the Fluctuation Spectrum By X-ray Scatteringmentioning
confidence: 99%
“…We then treat the bilayer as a weak perturbation. 53 Within this approximation, the diffuse scattering cross section ͑intensity scattered per unit solid angle ⍀ in the direction k sc per unit of incident flux in the direction k in ͒ ͑see Fig. 15͒ 20,54 This perturbation is related to the electronic density correlation function ͗␦͑r͒␦͑rЈ͒͘ and originates from electrondensity lateral heterogeneities: this can, for instance, result from the presence of pores 55 or domains after phase separation.…”
Section: Direct Study Of the Fluctuation Spectrum By X-ray Scatteringmentioning
confidence: 99%
“…In the case of GIXD, however, fewer reports exist on multiple-scattering events, although the peak positions can be significantly influenced by refraction effects of the X-rays (Breiby et al, 2008;Toney & Brennan, 1989). The theoretical treatment of X-ray scattering from thin films taking into account multiple scattering from surfaces can be performed using the distorted wave Born approximation (Daillant & Alba, 2000;Lazzari, 2009).…”
Section: Introductionmentioning
confidence: 99%
“…[21][22][23][24][25][26][27] The vertical structure of the samples was investigated by x-ray reflectometry. All these techniques are well suited for the characterization of mesoscopic and nanoscopic structures of polymer materials at the interface [21][22][23][24][25][26][27] and will allow us to understand the basis of the excellent suitability of cellulose films as supports for native and artificial lipid membranes.…”
Section: Introductionmentioning
confidence: 99%