2013 IEEE 14th Workshop on Control and Modeling for Power Electronics (COMPEL) 2013
DOI: 10.1109/compel.2013.6626465
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High speed thermal coupling measurements for multichip electro-thermal model validation

J. Reichl
1
,
J.M. Ortiz-Rodríguez
2
,
Allen R. Hefner
3
et al.
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