2015
DOI: 10.1007/s00339-015-9267-0
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High-temperature annealing effect of α-Al2O3 (0001) substrates with nominal 0.25° miscut toward the a-plane $${\mathbf{ \left( {11\overline{2} 0} \right)}}$$ 11 2 ¯ 0 on ZnO films grown by MOCVD

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Cited by 5 publications
(6 citation statements)
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“…1(f), the RMS value exhibits a monotonically decreasing trend with increasing annealing temperatures. Moreover, despite poorly defined terrace edges, a similar terrace-and-step morphology appears on the 1050 °C-annealed substrate, which is similar to previously reported results [17,19]. It was reported that there are several ordered phases on the c-plane surface of sapphire that can transform into each other under thermal treatment [19].…”
Section: Methodssupporting
confidence: 89%
See 1 more Smart Citation
“…1(f), the RMS value exhibits a monotonically decreasing trend with increasing annealing temperatures. Moreover, despite poorly defined terrace edges, a similar terrace-and-step morphology appears on the 1050 °C-annealed substrate, which is similar to previously reported results [17,19]. It was reported that there are several ordered phases on the c-plane surface of sapphire that can transform into each other under thermal treatment [19].…”
Section: Methodssupporting
confidence: 89%
“…As a consequence, the crystal quality of the β-Ga 2 O 3 epitaxial film could be degraded because the coherence degree at the interface between the epitaxial film and substrate greatly impacts defect formation, strain transfer and evolution of the film surface. Pretreatment of sapphire substrate by thermal annealing has been reported to effectively improve the crystal quality of ZnO and ZnMgO epitaxial films [16,17]. However, few studies have systematically investigated the effects of similar pretreatment on the crystal quality of β-Ga 2 O 3 epitaxial film or the performance of β-Ga 2 O 3 PD.…”
Section: Introductionmentioning
confidence: 99%
“…It is well established in GaN-related material growth that atomically smooth surfaces of sapphire can be made by a high temperature annealing at ≈1100 °C which activates atomic surface migration toward atomic steps. [31] The same conditions are expected for the curved surfaces, however their restructuring on atomic scale is not affecting the macroscopic shape alteration (lens in this case). Compared with a glass heat reflow, such atomic level surface re-crystallization has more advantages in maintaining the curved shape of the lens because the major volume of material is not softened (Figure S3, Supporting Information).…”
Section: Femtosecond Laser 3d Sculpturing and Improvement Of Surface ...supporting
confidence: 56%
“…Before deposition of the Ga 2 O 3 thin film, the Si substrate was vacuum annealed at 650 °C for 30 min, as per the temperature profile given in Figure (a,b). This process helps the surface reconstruction of silicon, thereby suppressing the presence of irregularities caused by mechanochemical mirror polishing at the topmost surface. , The vacuum annealing might also help to obtain a smooth gallium oxide surface. , The growth temperature profile and different steps to fabricate a gallium oxide based MSM-DUV-PD are presented in Figure (a–c). Figure (a) shows the temperature profile to grow a gallium oxide thin film without a seed layer, while Figure (b) shows the temperature profile to grow a gallium oxide thin film with a high-temperature seed layer.…”
Section: Methodsmentioning
confidence: 99%
“…24,30 The vacuum annealing might also help to obtain a smooth gallium oxide surface. 31,32 The growth temperature profile and different steps to fabricate a gallium oxide based MSM-DUV-PD are presented in Figure 1(a−c). Figure 1(a) shows the temperature profile to grow a gallium oxide thin film without a seed layer, while Figure 1(b) shows the temperature profile to grow a gallium oxide thin film with a high-temperature seed layer.…”
Section: ■ Experimental Sectionmentioning
confidence: 99%